The three-point bending behavior of a single Au nanowire deformed by an atomic force\nmicroscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray\nbeam. Three-dimensional reciprocal-space maps were recorded before and after deformation by\nstandard rocking curves and were measured by scanning the energy of the incident X-ray beam\nduring deformation at different loading stages. The mechanical behavior of the nanowire was\nvisualized in reciprocal space and a complex deformation mechanism is described. In addition to the\nexpected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified\nfrom the high-resolution diffraction data.
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